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Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
description
Scope
1.1 This test method covers how 2N2222A silicon bipolar transistors can be used either as dosimetry sensors in the determination of neutron energy spectra, or as silicon 1-MeV equivalent displacement damage fluence monitors.
Details
Publisher
ASTM
File size
144.97 KB
Pages
11
Format
PDF
Publication date
2017-08-16
ISBN-13
978-9-267-10188-0
ISBN-13 plain
9789267101880
ISBN-10
9267101889
