Significance and Use
5.1 This procedure is suitable for manufacturing control and for verifying that the product meets specifications. It provides rapid, multi-element determinations with sufficient accuracy to assure product quality. The analytical performance data included may be used as a benchmark to determine if similar X-ray spectrometers provide equivalent precision and accuracy, or if the performance of a particular spectrometer has changed.
Scope
1.1 This test method covers the analysis of Ni-base alloys by wavelength dispersive X-ray Fluorescence Spectrometry for the determination of the following elements:
| Element | Composition Range |
| Manganese | 0.06 % to 1.6 % |
| Phosphorus | 0.008 % to 0.015 % |
| Silicon | 0.08 % to 0.6 % |
| Chromium | 1.6 % to 22 % |
| Nickel | 23 % to 77 % |
| Aluminum | 0.20 % to 1.3 % |
| Molybdenum | 0.03 % to 10 % |
| Copper | 0.007 % to 2.5 % |
| Titanium | 0.11 % to 3.0 % |
| Niobium | 0.55 % to 5.3 % |
| Iron | 0.17 % to 46 % |
| Tungsten | 0.06 % to 0.50 % |
| Cobalt | 0.04 % to 0.35 % |
