summary
Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
description
Scope
1.1 This guide defines the detailed requirements for testing microcircuits for short pulse high dose-rate ionization-induced failure. Large flash x-ray (FXR) machines operated in the photon mode, or FXR e-beam facilities are required because of the high dose-rate levels that are necessary to cause burnout. Two modes of test are possible (1) survival test, and (2) A failure level test.
1.2 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this standard.
Details
Publisher
ASTM
File size
35.83 KB
Pages
5
Format
PDF
Publication date
2017-08-16
