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summary
1149.10-2017 - IEEE Standard for High-Speed Test Access Port and On-Chip Distribution Architecture
description
Standard number: 1149.10-2017. Status: Active. DOI: 10.1109/IEEESTD.2017.7995164
Details
Publisher
IEEE
File size
3.59 MB
Pages
96
Format
PDF
Publication date
2017-12-01
ISBN-13
978-1-504-43995-4
ISBN-13 plain
9781504439954
ISBN-10
1504439954