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summary
1505.1-2008 - IEEE Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
description
Standard number: 1505.1-2008. Status: Active. DOI: 10.1109/IEEESTD.2008.4689504
Details
Publisher
IEEE
File size
1.93 MB
Pages
170
Format
PDF
Publication date
2008-12-01
ISBN-13
978-0-738-15810-5
ISBN-13 plain
9780738158105
ISBN-10
0738158105