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summary
1620-2004 - Standard for Test Methods for the Characterization of Organic Transistors and Materials
description
Standard number: 1620-2004. Status: Superseded. DOI: 10.1109/IEEESTD.2004.94492
Details
Publisher
IEEE
File size
146.31 KB
Pages
20
Format
PDF
Publication date
2004-12-01
ISBN-13
978-0-738-13992-0
ISBN-13 plain
9780738139920
ISBN-10
0738139920