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summary
1620-2008 - IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials - Redline
description
Standard number: 1620-2008. Status: Inactive.
Details
Publisher
IEEE
File size
1.17 MB
Pages
27
Format
PDF
Publication date
2008-12-01
ISBN-13
978-7-329-81006-0
ISBN-13 plain
9787329810060
ISBN-10
7329810060