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summary
1838-2019 - IEEE Standard for Test Access Architecture for Three-Dimensional Stacked Integrated Circuits
description
Standard number: 1838-2019. Status: Active. DOI: 10.1109/IEEESTD.2020.9036129
Details
Publisher
IEEE
File size
3.9 MB
Pages
73
Format
PDF
Publication date
2020-12-01