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summary
2427-2025 - IEEE Standard for Analog Defect Modeling and Coverage
description
Standard number: 2427-2025. Status: Active. DOI: 10.1109/IEEESTD.2025.11343929
Details
Publisher
IEEE
File size
3.89 MB
Pages
112
Format
PDF
Publication date
2026-12-01
ISBN-13
979-8-855-72776-0
ISBN-13 plain
9798855727760
ISBN-10
8855727760