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summary
300-1969 - USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)
description
Standard number: 300-1969. Status: Superseded. DOI: 10.1109/IEEESTD.1968.8684368
Details
Publisher
IEEE
File size
1.62 MB
Pages
14
Format
PDF
Publication date
1968-12-01