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summary
62528-2007 - IEC 62528 Ed. 1 (IEEE Std 1500(TM)-2005): Standard Testability Method for Embedded Core-based Integrated Circuits
description
Standard number: 62528-2007. Status: Superseded. DOI: 10.1109/IEEESTD.2007.4410238
Details
Publisher
IEEE
File size
2.07 MB
Pages
130
Format
PDF
Publication date
2007-12-01
ISBN-13
978-2-831-89481-2
ISBN-13 plain
9782831894812
ISBN-10
2831894816