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summary
C62.35-2010/Cor 1-2018 - IEEE Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components--Corrigendum 1
description
Standard number: C62.35-2010/Cor 1-2018. Status: Superseded. DOI: 10.1109/IEEESTD.2018.8577048
Details
Publisher
IEEE
File size
2.23 MB
Pages
11
Format
PDF
Publication date
2018-12-01
ISBN-13
978-1-504-45314-1
ISBN-13 plain
9781504453141
ISBN-10
1504453141