loading preview...
summary
N42.31-2003 - American National Standard for Measurement Procedures for Resolution and Efficiency of Wide-Bandgap Semiconductor Detectors of Ionizing Radiation
description
Standard number: N42.31-2003. Status: Active. DOI: 10.1109/IEEESTD.2003.94425
Details
Publisher
IEEE
File size
380.47 KB
Pages
41
Format
PDF
Publication date
2003-12-01
ISBN-13
978-0-738-13798-8
ISBN-13 plain
9780738137988
ISBN-10
0738137987