EOS – Electrical Overstress in the Automotive Industry: Dealing with semiconductor devices showing a signature of electrical overstress
A VDA-QMC guideline for analyzing, classifying, and resolving electrically induced physical damage in automotive semiconductor devices.
Publication date:
2020
ISBN:
978-1-58537-300-1
Points:
774
File size:
6.61 MB
Pages:
68
Format:
PDF
Language:
English