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summary
63003-2015 - IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)
description
Standard number: 63003-2015. Status: Active. DOI: 10.1109/IEEESTD.2015.7358452
Details
Publisher
IEEE
File size
10.61 MB
Pages
175
Format
PDF
Publication date
2015-12-01
ISBN-13
978-2-832-22941-5
ISBN-13 plain
9782832229415
ISBN-10
2832229415