IEC/IEEE 63003-2015 - Page 3

Name: IEC/IEEE 63003-2015
Brand: IEEE
SKU: iec-ieee-63003-2015

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63003-2015 - IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)

description

Standard number: 63003-2015. Status: Active. DOI: 10.1109/IEEESTD.2015.7358452

Details

Publisher IEEE

File size 10.61 MB

Pages 175

Format PDF

Publication date 2015-12-01

ISBN-13 978-2-832-22941-5

ISBN-13 plain 9782832229415

ISBN-10 2832229415

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File size 10.61 MB

Pages 175

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Publication date 2015-12-01

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