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summary
1181-1991 - IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated-Circuit Process Characterization
description
Standard number: 1181-1991. Status: Inactive. DOI: 10.1109/IEEESTD.1991.101074
Details
Publisher
IEEE
File size
1.95 MB
Pages
36
Format
PDF
Publication date
1991-12-01
ISBN-13
978-1-559-37152-0
ISBN-13 plain
9781559371520
ISBN-10
1559371528