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summary
1505.1-2019 - IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505 - Redline
description
Standard number: 1505.1-2019. Status: Active.
Details
Publisher
IEEE
File size
18.76 MB
Pages
196
Format
PDF
Publication date
2019-12-01
ISBN-13
978-1-504-45975-4
ISBN-13 plain
9781504459754
ISBN-10
7329810060