EOS – Electrical Overstress in the Automotive Industry: Dealing with semiconductor devices showing a signature of electrical overstress - Page 2

A VDA-QMC guideline for analyzing, classifying, and resolving electrically induced physical damage in automotive semiconductor devices.

This first-edition VDA-QMC guideline presents a structured approach for handling semiconductor devices that show an electrical overstress signature in automotive applications. It introduces electrically induced physical damage (EIPD), defines complaint-handling flows, and provides investigation steps for semiconductor manufacturers, Tier 1 suppliers, and OEMs. The publication covers statistical analysis, assessment and escalation procedures, root-cause analysis across the device life cycle, Level 2 information requirements, and practical case studies involving automotive electronic control units, vehicle assembly, and downstream failures.

Application Scope: Automotive semiconductor quality management, electrical overstress investigations, EIPD failure analysis, supplier escalation, and root-cause analysis across semiconductor manufacturers, Tier 1 suppliers, and OEMs.