JEDEC JESD28-A 2001

Name: JEDEC JESD28-A 2001
Brand: JEDEC
SKU: jedec-jesd28-a-2001

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summary

A PROCEDURE FOR MEASURING N-CHANNEL MOSFET HOT-CARRIER-INDUCED DEGRADATION UNDER DC STRESS:

Details

Publisher JEDEC

File size 60.48 KB

Pages 20

Format PDF

Publication date 2001-12-01

Rating ★★★★★

Points 540

File size 60.48 KB

Pages 20

Format PDF

Publication date 2001-12-01

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