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summary
TRANSIENT DUAL INTERFACE TEST METHOD FOR THE MEASUREMENT OF THE THERMAL RESISTANCE JUNCTION-TO-CASE OF SEMICONDUCTOR DEVICES WITH HEAT FLOW THROUGH A SINGLE PATH
Details
Publisher
JEDEC
File size
434.08 KB
Pages
46
Format
PDF
Publication date
2010-12-01
ISBN-13
978-0-112-10210-6
ISBN-13 plain
9780112102106
ISBN-10
0112102101
