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JEDEC

Joint Electron Device Engineering Council

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JEDEC JESD40 1994

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JEDEC JESD40 1994 PROCUREMENT QUALITY OF SOLID STATE COMPONENTS BY GOVERNMENT CONTRACTORS - SUPERSEDED BY EIA-623, July 1994

Publication date: 1994-12-01 Points: 540 File size: 309.19 KB Pages: 9 Format: PDF

JEDEC JESD4 1983

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JEDEC JESD4 1983 DEFINITION OF EXTERNAL CLEARANCE AND CREEPAGE DISTANCES OF DISCRETE SEMICONDUCTOR PACKAGES FOR THYRISTORS AND RECTIFIER DIODES:

Publication date: 1983-12-01 Points: 540 File size: 278.69 KB Pages: 10 Format: PDF

JEDEC JESD398 1972

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JEDEC JESD398 1972 MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE:

Publication date: 1972-12-01 Points: 540 File size: 422.03 KB Pages: 18 Format: PDF

JEDEC JESD390A 1981

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JEDEC JESD390A 1981 STANDARD TEST PROCEDURE FOR NOISE MARGIN MEASUREMENTS FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITS, Reaffirmed September 2003. RESCINDED October 2008

Publication date: 1981-12-01 Points: 540 File size: 21.71 KB Pages: 1 Format: PDF

JEDEC JESD381-A 1981

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JEDEC JESD381-A 1981 METHOD OF DIODE Q MEASUREMENT:

Publication date: 1981-12-01 Points: 540 File size: 416.99 KB Pages: 23 Format: PDF

JEDEC JESD38 1995

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JEDEC JESD38 1995 STANDARD FOR FAILURE ANALYSIS REPORT FORMAT:

Publication date: 1995-12-01 Points: 540 File size: 283.31 KB Pages: 13 Format: PDF

JEDEC JESD37A 2017

JEDEC ★★★★★

JEDEC JESD37A 2017 STANDARD LOGNORMAL ANALYSIS OF UNCENSORED DATA, AND OF SINGLY RIGHT -CENSORED DATA UTILIZING THE PERSSON AND ROOTZEN METHOD:

Publication date: 2017-12-01 Points: 540 File size: 562.85 KB Pages: 36 Format: PDF

JEDEC JESD372 1970

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JEDEC JESD372 1970 THE MEASUREMENT OF SMALL-SIGNAL VHF-UHF TRANSISTOR ADMITTANCE PARAMETERS:

Publication date: 1970-12-01 Points: 540 File size: 351.86 KB Pages: 18 Format: PDF

JEDEC JESD371 1970

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JEDEC JESD371 1970 THE MEASUREMENT OF SMALL-SIGNAL VHF-UHF TRANSISTOR SHORT-CIRCUIT FORWARD CURRENT TRANSFER RATIO:

Publication date: 1970-12-01 Points: 540 File size: 319.68 KB Pages: 16 Format: PDF

JEDEC JESD370B 1982

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JEDEC JESD370B 1982 DESIGNATION SYSTEM FOR SEMICONDUCTOR DEVICES:

Publication date: 1982-12-01 Points: 540 File size: 354.5 KB Pages: 14 Format: PDF

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JEDEC JESD82-513-2023

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JEDEC JEP162A-2019

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jedec JEP 122G

jedec JEP 122G

JEDEC JEP122G provides reliability models and acceleration factors for common semiconductor device failure mechanisms.

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JEDEC JESD79-3-3 2013

JEDEC JESD79-3-3 2013

ADDENDUM No. 3 to JESD79-3 - 3D STACKED SDRAM

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JEDEC JESD79-4-1B-2021

JEDEC JESD79-4-1B-2021

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IPC JEDEC 9301-2018

IPC JEDEC 9301-2018

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JEDEC CS-002-A 1993

JEDEC CS-002-A 1993

Standard - Thin Matrix Tray for Handling and Shipping of Plastic Qual Flatpack Packages (PQFP). Variations AA-AG. Ite...

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IPC JEDEC 9703-2009 (2019)

IPC JEDEC 9703-2009 (2019)

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JEDEC JESD82-30.01-2023

JEDEC JESD82-30.01-2023

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JEDEC CO-022-A 0

JEDEC CO-022-A 0

Registration - Plastic Magazine Plug Family. Variations AA-AC. Item 11.5-340.

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EIA JEDEC JESD67-1999 errata 1999

EIA JEDEC JESD67-1999 errata 1999

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JEDEC JESD88E 2013

JEDEC JESD88E 2013

DICTIONARY OF TERMS FOR SOLID-STATE TECHNOLOGY, 6th Edition

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JEDEC SO-009A 2007

JEDEC SO-009A 2007

Registration - DDR2 DIMM 240 Pin SMT Socket Outline with 1.00 mm Contact Centers. Item 11.14-097.

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JEDEC SO-005A 2005

JEDEC SO-005A 2005

Registration - 200 pin Mini DIMM with 0.60 mm Lead Centers Socket Outline