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Tag: semiconductor reliability

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2 results

JEDEC

jedec JEP 122G JEDEC JEP122G provides reliability models and acceleration factors for common semiconductor device failure mechanisms.

Publication date: 2011-10 Points: 530 File size: 2.11 MB Pages: 108 Format: PDF Language: English

Development of Atmospheric Neutron Single Event Effects Analysis for Use in Safety Assessments

SAE

Development of Atmospheric Neutron Single Event Effects Analysis for Use in Safety Assessments An SAE Aerospace Information Report providing an example process for analyzing atmospheric neutron single event effects in airborne electronic systems for safety assessments.

Publication date: 2018-08 Points: 0 File size: 542.32 KB Pages: 28 Format: PDF Language: English