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Testing of ceramic and basic materials. Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) with electrothermal vaporisation (ETV). | Status: Revised, Superseded, Withdrawn
Details
Publisher
BS
File size
1.1 MB
Pages
32
Format
PDF
Publication date
2011-02-28
ISBN-13
978-0-580-64180-0
ISBN-13 plain
9780580641800
ISBN-10
0580641800