What is BS EN 60444-6 - Drive level dependence (DLD) about?
BS EN 60444-6 is the sixth part of an international standard used for the Measurement of quartz crystal unit parameters. BS EN 60444-6 specifies the measuring methods for drive level dependence (DLD) that results in manufacturing good quality quartz crystal units.
BS EN 60444-6 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. “Method A”, based on the π-network according to IEC 60444-1, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the π- network or reflection method according to IEC 60444-1, IEC 60444-5, or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions.
Who is BS EN 60444-6 - Drive level dependence (DLD) for?
BS EN 60444-6 on Measurement of quartz crystal unit parameters is useful for:
- Manufacturer of electronic device
- Manufacturer of watches
- Manufacturer or radioactive devices
- Electronic engineer
Why should you use BS EN 60444-6 - Drive level dependence (DLD)?
Quartz is widely used within electronic devices. These quartz resonators are used as high-performance resonators for use in filters and oscillations.
BS EN 60444-6 specifies the test method for measuring the resonance frequencies of this drive.
The test methods are as follows:
- Method A is useful in selecting the drive level sensitive quartz crystal units.
- Method B helps in fulfilling the oscillation start-up requirements for high reliability devices.
- Method C is useful in measuring the fundamental mode of crystal units in larger quantities
With the help of BS EN 60444-6, you can understand the effects and causes of this drive level dependence (DLD). Hence this measuring method ensures reliability and sustainability which results in manufacturing good quality quartz crystal units.
What’s changed since the last update?
BS EN 60444-6:2013 supersedes BS EN 60444-6:1997. BS EN 60444-6:2013 includes some technical changes with respect to BS EN 60444-6:1997. These include:
- DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B.
- High reliability crystal unit is needed to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification.
