BS EN 60749-28:2017 - Page 2

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Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level | Status: Superseded, Withdrawn

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Publisher BS

File size 3.31 MB

Pages 50

Format PDF

Publication date 2017-07-10

ISBN-13 978-0-580-53678-6

ISBN-13 plain 9780580536786

ISBN-10 0580536786

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Points 918

File size 3.31 MB

Pages 50

Format PDF

Publication date 2017-07-10

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