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Semiconductor devices. Mechanical and climatic test methods. Neutron beam irradiated single event effect (SEE) test method for semiconductor devices | Status: Current
Details
Publisher
BS
File size
2.28 MB
Pages
26
Format
PDF
Publication date
2016-11-30
ISBN-13
978-0-580-86203-8
ISBN-13 plain
9780580862038
ISBN-10
0580862038