What is BS EN IEC 60749-5 - Steady-state temperature humidity bias life test of semiconductor devices about?   
BS EN IEC 60749 is an international standard covering steady-state temperature humidity bias life test of semiconductor devices, ensuring the operability and longevity of semiconductor devices in varying environments.
BS EN 60749-5 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. BS EN 60749-5 test method is considered destructive.
Who is BS EN 60749-5 - Steady-state temperature humidity bias life test of semiconductor devices for?  
BS EN 60749-5 on steady-state temperature humidity bias life test is relevant to:  
- Semiconductor device manufacturers
- Manufacturer of electronic devices  
- Product design engineers 
- Automobile industry 
- Electrical engineers 
- Fabricators 
Why should you use   BS EN 60749-5 - Steady-state temperature humidity bias life test of semiconductor devices?   
Semiconductor devices are electronic components that rely on the electronic properties of semiconductor materials for their function. They are usually made of semiconductor materials such as silicon, germanium, and gallium arsenide for their function.
BS EN 60749-5 provides a test that employs conditions of temperature, humidity, and bias, which accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along with the interface between the external protective material and the metallic conductors, which pass through it.
The test methods provided under BS EN 60749-5 helps you to avoid any mechanical damage such as cracking, chipping, or breaking that leads to overall product/application failure.  
Test apparatus requirements test conditions are described in BS EN 60749-5 helps you in maintaining a specified temperature and relative humidity continuously while providing electrical connections to the devices.
According to the BS EN 60749-5 failure criteria, a device is considered to have failed if it does not pass the prescribed endpoint tests or if its functionality cannot be demonstrated under nominal and worst-case scenarios.
Overall, BS EN 60749-5 can help you to minimize the release of contamination degradation due to corrosion and other mechanisms and maintain operational efficiency and the service life of the end application.
What’s changed since the last update?  
BS EN 60749-5:2017 supersedes BS EN 60749-5:2003, which is withdrawn. BS EN 60749-5:2017 includes some technical changes with respect to BS EN 60749-5:2003. This includes:
- Correction of an error in an equation
- Inclusion of notes for guidance
- Clarification of the applicability of test conditions
