What is BS EN IEC 60749-9 - Permanence of marking of semiconductor devices about?   
BS EN IEC 60749 is an international standard covering the permanence of marking of semiconductor devices, facilitating the marking and labelling of solid-state semiconductor devices for classification and authenticity of the devices.
The purpose of BS EN 60749-9 is to determine whether the marks on solid-state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of solvents and cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board manufacturing process.
BS EN 60749-9 test is applicable for all package types. It is suitable for use in qualification and/or process monitor testing. BS EN 60749-9 test is considered non-destructive. Electrical or mechanical rejects can be used for the purpose of this test.
NOTE: This procedure does not apply to laser branded packages.
NOTE: The composition of solvents used in BS EN 60749-9 is considered typical and representative of the desired stringency as far as the usual coatings and markings are concerned.
Who is BS EN 60749-9 - Permanence of marking of semiconductor devices for?  
BS EN 60749-9 on the permanence of marking is relevant to:  
- Semiconductor device manufacturers
- Dealers and importers of semiconductor devices
- Manufacturer of electronic devices
- Testing laboratories
- Product design engineers
- Automobile industry
- Electrical engineers
Why should you use BS EN 60749-9 - Permanence of marking of semiconductor devices?   
Semiconductor devices are electronic components that rely on the electronic properties of semiconductor materials for their function. They are usually made of semiconductor materials such as silicon, germanium, and gallium arsenide for their function.
BS EN 60749-9 provides users guidance on solvent test, tape pull test, and failure criteria to determine the permanence of marking to prevent counterfeiting.  
With the adoption of BS EN 60749-9, users can ensure the permanence of marking of semiconductor devices, enabling them to prevent the removal of product markings due to atmospheric conditions or other means.
What’s changed since the last update?  
BS EN 60749-9:2017 supersedes BS EN 60749‑9:2002, which is withdrawn. BS EN 60749-9:2017 includes some technical changes with respect to BS EN 60749‑9:2002. This includes:  
- Revision to Clause 4 Equipment by a complete rewriting of Clause 3 Terms and definitions
- Additional variant – ‘adhesive tape pull test’
