What is BS EN 61338-1-5 - Microwave measurement of conductivity between conductor layer and dielectric substrate about?
BS EN 61338-1-5 is the first series of an international standard used for dielectric resonators that specifies the measuring parameters and measurement methods for calculating interface resistance and interface conductivity. BS EN 61338-1-5 is useful in improving the quality of these Waveguide type dielectric resonators.
Microwave circuits are popularly formed on multi-layered organic or non-organic substrates. In microwave circuits, the attenuation of planar transmission lines such as straplines, microstrip lines, and coplanar lines are determined by their conductor loss, dielectric loss and radiation loss. Among them, conductor loss is a major factor in the attenuation of the planar transmission lines. A new measurement method is standardized in this document to evaluate the conductivity of transmission lines on or in the substrates such as the organic, ceramic and LTCC (low temperature co-fired ceramics) substrates.
BS EN 61338-1-5 describes a measurement method for resistance and effective conductivity at the interface between the conductor layer and dielectric substrate, which are called interface resistance and interface conductivity.
Who is BS EN 61338-1-5 - Microwave measurement of conductivity between conductor layer and dielectric substrate for?
BS EN 61338-1-5 on Waveguide type dielectric resonators is useful for:
- Manufacturer of radiofrequency circuits
- Manufacturer of electronic devices
- Manufacturer of communication devices
- Scientific laboratories
- Electronic engineers
Why should you use BS EN 61338-1-5 - Microwave measurement of conductivity between conductor layer and dielectric substrate?
A dielectric resonator is a piece of dielectric (nonconductive but polarizable) material, usually ceramic. These dielectric resonators are designed to function as a resonator for radio waves, generally in the microwave and millimetre wave bands.
BS EN 61338-1-5 specifies the measuring parameters, measuring methods and procedures for calculating resistance and conductivity at the interface between the conductor layer and dielectric substrate.
BS EN 61338-1-5 can be your best guide in performing these measurement methods which are as follows:
- Resonant frequency is useful in measuring the interface resistance which helps in improving the quality of resonators.
- The interface conductivity and relative interface conductivity is calculated by using measured interface resistance.
- This method is useful in assuring the uncertainty of relative interface conductivity is less than 5%
By applying BS EN 61338-1-5, you can ensure the resistibility of these resonators which results in standardizing the manufacturing process of these dielectric resonators.
What’s changed since the last update?
BS EN 61338-1-5:2015 supersedes DD IEC/PAS 61338-1-5:2010. BS EN 61338-1-5:2015 includes some technical changes with respect to DD IEC/PAS 61338-1-5:2010. These include:
- Description of technical content related to patents (Japanese patent numbers JP3634966, JP3735501) in the Introduction
- Changes to normative references
- Addition to bibliography
