What is BS EN 62047-7 - MEMS BAW and duplexer devices about?
BS EN 62047-7 is the seventh part of the multi-series standard used for Semiconductor devices.
BS EN 62047-7 describes terms, definitions, symbols, configurations, and test methods that can be used to evaluate and determine the performance characteristics of the BAW resonator, filter, and duplexer devices as radio frequency control and selection devices. This standard specifies the methods of tests and general requirements for BAW resonator, filter, and duplexer devices of assessed quality using either capability or qualification approval procedures.
Who is BS EN 62047-7 - MEMS BAW and duplexer devices for?
BS EN 62047-7on Semiconductor devices are useful for:
- Manufacturers of semiconductor devices
- Manufacturers of electronic devices
- Manufacturers of automotive parts
- Electronic engineers
- Semiconductor foundries
- Quality control executives
Why should you use BS EN 62047-7 - MEMS BAW and duplexer devices?
Micro-electromechanical systems (MEMS) are a process technology that is useful in creating tiny integrated devices or systems. These devices are useful in combining mechanical and electrical components.
BS EN 62047-7 specifies the test methods and test procedures for radio frequency control and selection. This test method helps in measuring the BAW filters and duplexers by using a network analyzer. With the help of BS EN 62047-7, you can determine the characteristics and parameters of these resonators, filters, and duplex marking.
By applying BS EN 62047-7 you can evaluate the performances and ensure the reliability of these devices. This helps in manufacturing good quality MEMS BAW filter and duplexer devices.
