BS EN 62220-1-3:2008 Medical electrical equipment. Characteristics of digital X-ray imaging devices. Determination of the detective quantum efficiency. Detectors used in dynamic imaging
BS EN 62220-1-3 specifies the method for the determination of the DETECTIVE QUANTUM EFFICIENCY (DQE) of DIGITAL X-RAY IMAGING DEVICES as a function of AIR KERMA and of SPATIAL FREQUENCY for the working conditions in the range of the medical application as specified by the MANUFACTURER. BS EN 62220-1-3 is intended for manufacturers and well equipped test laboratories.
BS EN 62220-1-3 is restricted to DIGITAL X-RAY IMAGING DEVICES that are used for dynamic imaging such as, but not exclusively, direct and indirect flat panel-detector based systems.
BS EN 62220-1-3 is not recommended for digital X-RAY IMAGE INTENSIFIER-based systems.
BS EN 62220-1-3 does not apply to:
- DIGITAL X-RAY IMAGING DEVICES intended to be used in mammography or in dental radiography
- COMPUTED TOMOGRAPHY
- Systems in which the X-ray field is scanned across the patient.
Contents of BS EN 62220-1-3:
- Introduction
- Scope
- Normative references
- Terms and definitions
- Requirements
- Operating conditions
- X-RAY EQUIPMENT
- RADIATION QUALITY
- TEST DEVICE
- Geometry
- IRRADIATION conditions
- General conditions
- AIR KERMA measurement
- LAG EFFECTS
- IRRADIATION to obtain the CONVERSION FUNCTION
- IRRADIATION for determination of the NOISE POWER SPECTRUM and LAG
- EFFECTS
- IRRADIATION with TEST DEVICE in the RADIATION BEAM
- Overview of all necessary IRRADIATIONS Corrections of RAW DATA
- Determination of the DETECTIVE QUANTUM EFFICIENCY
- Definition and formula of DQE(u,v)
- Parameters to be used for evaluation
- Determination of different parameters from the images
- Linearization of data
- The LAG EFFECTS corrected NOISE POWER SPECTRUM (NPS)
- Determination of the MODULATION TRANSFER FUNCTION (MTF
- Format of conformance statement
- Accuracy
- Annex A (informative) Determination of LAG EFFECTS
- Annex B (informative) Calculation of the input NOISE POWER SPECTRUM
- Bibliography
- Index of defined terms
