What is BS EN IEC 60747‑5‑5 about?
BS EN IEC 60747 series covers semiconductor devices.BS EN IEC 60747‑5‑5 is an international standard for Semiconductor devices that specifies the test methods which ensures the safety of devices and helps in measuring the photocouplers.
BS EN IEC 60747‑5‑5 specifies the terminology, essential ratings, characteristics, safety tests, as well as the measuring methods for photocouplers.
Note: The term "optocoupler" can also be used instead of "photocoupler"
Who is BS EN IEC 60747‑5‑5 for?
BS EN IEC 60747‑5‑5 on s devices is useful for:
- Semiconductor foundries
- Manufacturer of automotive parts
- Manufacturer of electronic devices
Why should you use BS EN IEC 60747‑5‑5?
Optocouplers are sometimes referred to as optoisolators and photocouplers. They are semiconductor devices that provide electrical isolation while coupling a signal from one electrical circuit to another through a brief optical route.
BS EN IEC 60747‑5‑5 helps in determining the electrical characteristics of the photocoupler and helps in designing this photocoupler. Designing these photocouplers can help you in providing protection against electric shock.
The isolation test given in BS EN IEC 60747-5-5 helps in verifying the ability of the device to withstand the isolation test voltage. You can also in verify how the Optoelectronic device works normally under specified conditions.
BS EN IEC 60747‑5‑5 specifies the test methods for conducting the test and also ensures electrical and environmental safety. The endurance test is useful in producing better quality semiconductor devices and helps in sustaining these devices.
What’s changed since the last update?
BS EN IEC 60747‑5‑5:2020 supersedes BS EN 60747‑5‑5:2011+A1:2015. BS EN IEC 60747‑5‑5:2020 includes some technical changes with respect to BS EN 60747‑5‑5:2011+A1:2015. These include:
- Optional data sheet basic insulation rating in accordance with IEC 60664-1:2007, 6.1.3.5
- Editorial corrections on the use of VIORM
- Editorial corrections on Figure 2: Time intervals for method b
- Addition of an alternative surge pulse VIOSM test method.
