What is BS EN IEC 60749-39 - Mechanical and climatic test methods for organic materials about?
BS EN IEC 60749-39 semiconductor devices and mechanical and climatic test methods with a focus on measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components.
BS EN IEC 60749-39 is the 39th part of the multi-series on semiconductor devices that details the procedures for the measurement of the characteristic properties of moisture diffusivity and water solubility in organic materials used in the packaging of semiconductor components.
These two material properties are important parameters for the effective reliability performance of plastic packaged semiconductors after exposure to moisture and being subjected to high-temperature solder reflow.
Who is BS EN IEC 60749-39 - Mechanical and climatic test methods for organic materials for?
BS EN IEC 60749-39 on mechanical and climatic test methods for organic materials is useful for:
- Organic materials for semiconductor components manufacturers
- Organic materials for semiconductor components test personnel
- Semiconductor components manufacturers
Why should you use BS EN IEC 60749-39- Mechanical and climatic test methods for organic materials?
The semiconductor device is an electronic component that depends on the electronic properties of semiconductor material for its function. These semiconductors conduct electric current in the solid-state, rather than as free electrons across a vacuum or as free electrons and ions through an ionized gas.
BS EN IEC 60749-39 discusses apparatus, samples, procedure, calculation of activation energy for moisture diffusion, and calculation of functional fit for solubility.
BS EN IEC 60749-39 is your best practice guide while conducting the test method for semiconductor devices. the mechanical and climatic test method helps in creating an estimate of ionizing radiation effects on semiconductor devices.
With obedience and compliance to BS EN IEC 60749-39, you can enhance organic materials used for semiconductor components’ effectiveness and efficacy and manufacture a standardized product.
