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summary
Semiconductor devices. Mechanical and climatic test methods. Steady-state temperature humidity bias life test | Status: Current
description
1 Scope
This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.
This test method is considered destructive.
Details
Publisher
BS
File size
844.63 KB
Pages
14
Format
PDF
Publication date
2024-02-06
ISBN-13
978-0-539-23216-5
ISBN-13 plain
9780539232165
ISBN-10
0539232165