What is IEC 63185 about?
IEC 63185 specifies a measurement method for complex permittivity of dielectric substrates at microwave and millimetre-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimetre-wave circuits and devices.
The method outlined in IEC 63185 uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is considered accurately on the basis of the mode-matching analysis.
In comparison with the conventional method described in IEC 62810 and IEC 61338-1-3, this method has the following characteristics:
- The values of the relative permittivity εr’ and loss tangent tanδ normal to dielectric plate samples can be measured accurately and non-destructively
- This method presents broadband measurements by using higher-order modes by one resonator
- This method is applicable for the measurements on the following condition
Who is IEC 63185 for?
IEC 63185 on complex permittivity is applicable to:
- Microwave communication engineers
- Scientists and applied physicists
- Electrical and electronics engineers
- Advanced microwave
- MM-Wave 
- THz devices
- Microwave and millimetre-wave circuits and devices
Why should you use IEC 63185?
IEC 63185 provides a method to evaluate the dielectric properties of low-loss materials used in microwave and millimetre-wave circuits and devices. The low use of low-loss materials improves the quality and efficiency of microwave and millimetre-wave circuits and devices.
Apply IEC 63185 guidelines of measurement of the complex permittivity in the low-loss dielectric to improve the performance of microwave and millimetre-wave circuits and devices.
