loading preview...
summary
Semiconductor devices. Generic semiconductor qualification guidelines. Guidelines for IC reliability qualification | Status: Current
description
1 Scope
This part of IEC 63287 gives guidelines for reliability qualification plans of semiconductor integrated circuit products. This document is not intended for military- and space-related applications.
NOTE 1 The manufacturer can use flexible sample sizes to reduce cost and maintain reasonable reliability by this guideline adaptation based on EDR-4708, AEC Q100, JESD47 or other relevant document can also be applicable if it is specified.
NOTE 2 The Weibull distribution method used in this document is one of several methods to calculate the appropriate sample size and test conditions of a given reliability project.
Details
Publisher
BS
File size
1.58 MB
Pages
50
Format
PDF
Publication date
2021-11-30
ISBN-13
978-0-539-12723-2
ISBN-13 plain
9780539127232
ISBN-10
0539127232
