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Chemical analysis of raw materials and refractory products containing silicon-carbide, silicon-nitride, silicon-oxynitride and sialon. XRD methods | Status: Current
description
1 Scope
This document describes methods for the determination of mineralogical phases typically apparent in nitride and oxy-nitride bonded silicon carbide refractory products using a Bragg-Brentano diffractometer.
It includes details of sample preparations and general principles for qualitative and quantitative analyses of mineralogical phase composition. Quantitative determination of α-Si3N4, β-Si3N4, Si2ON2, AlN, and β’- SiAlON are described.
For quantitative determination of α-Si3N4, β-Si3N4, Si2ON2, AlN and β’-SiAlON refinement procedures based on the total nitrogen content of the sample are described.
NOTE ISO 21068‑3 is used for the analysis of the total nitrogen content of the sample.
Details
Publisher
BS
File size
997.92 KB
Pages
20
Format
PDF
Publication date
2024-06-21
ISBN-13
978-0-539-20094-2
ISBN-13 plain
9780539200942
ISBN-10
0539200942