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Ellipsometry. Principles. | Status: Current
description
1 Scope
This document specifies a method for determining optical and dielectric constants in the UV-VIS-NIR spectral range as well as layer thicknesses in the field of at-line production control, quality assurance and material development through accredited test laboratories.
It is applicable to stand-alone measuring systems. The presentation of the uncertainty of results conforms to ISO/IEC Guide 98‑3.
Details
Publisher
BS
File size
1.09 MB
Pages
24
Format
PDF
Publication date
2021-04-27
ISBN-13
978-0-539-21455-0
ISBN-13 plain
9780539214550
ISBN-10
0539214550