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Carbon based films. Determination of optical properties of amorphous carbon films by spectroscopic ellipsometry. | Status: Current
description
1 Scope
This document specifies spectroscopic ellipsometry for the determination of optical properties (refractive indexn and extinction coefficientk) and the optical classification of different types of amorphous carbon films within the n-k plane.
It is applicable to amorphous carbon films deposited by ionized evaporation, sputtering, arc deposition, plasma-assisted chemical vapour deposition, hot filament techniques and others.
It does not apply to carbon films modified with metals or silicon, amorphous carbon films that have a gradient of composition/property in the thickness, paints and varnishes.
Details
Publisher
BS
File size
877.79 KB
Pages
16
Format
PDF
Publication date
2021-05-07
ISBN-13
978-0-539-21456-7
ISBN-13 plain
9780539214567
ISBN-10
0539214567