What is ISO 4518 about?
ISO 4518 specifies a method for the measurement of metal coating thickness. This is done by first forming a step between the surface of the coating and the surface of its substrate and then measuring the step height using a profile recording instrument. ISO 4518 covers the instrumentation characteristics and the procedure appropriate to this specific application of profilometric methods.
ISO 4518 is applicable to the measurement of thicknesses of metal coatings from 0,01 μm to 1 000 μm on flat surfaces and, if appropriate precautions are taken, on cylindrical surfaces. It is highly suitable for the measurement of minute thicknesses but, for thicknesses of less than 0,01 μm, surface flatness and surface smoothness are very critical and, accordingly, the method is not suitable for use down to the lowest level of measurement usual for electronic stylus instruments. The method is suitable for measuring coating thicknesses when preparing coating thickness reference standards.
Who is ISO 4518 for?
ISO 4518 on Metallic coatings is applicable in the following industries:
- Automotive manufacturers
- Structures construction
- Trains, airplanes, boat manufacturers
- Quality control laboratories
- Quality managers/assessors
Why should you use ISO 4518?
Standardization in metallic coating procedures is important to protect the metals from damage by exposure to chemicals, temperature and pressure. The guidelines in ISO 4518 assist you in determining metallic coating thickness on metals that provide corrosion, abrasion, and chemical resistance.
ISO 4518 helps to improve the quality of Metallic coatings on metals.
ISO 4518 also aids in the calibration of the length measuring device on the microscope, which is used to measure coating thickness. Not only does it increase longevity, but compliance with the standards informs customers that the quality and performance of the products are the best in industry.
What’s changed since the last update?
BS EN ISO 4518:2021 supersedes BS EN ISO 4518:1995, which is withdrawn.
The technical changes compared with the previous edition are as follows:
- Optical profilometers such as confocal microscopes or interference microscopes have been added as alternatives to stylus instruments for the measurement of the step height
- A description of more modern stylus profilometers has been added
