What is BS IEC 60747-14-1 - Semiconductor sensors about?
BS IEC 60747-14-1 is the 14th part of a multi-series standard used for Semiconductor devices that specifies the test method for semiconductor sensors. This results in manufacturing good quality semiconductor sensors.
BS IEC 60747-14-1 describes general items concerning the specifications for sensors,
which are the basis for specifications given in other parts of this series for various types of sensors. Sensors described in this standard are basically made of semiconductor materials, however, the statements made in this standard are also applicable to sensors using materials other than semiconductors, for example dielectric and ferroelectric materials.
Who is BS IEC 60747-14-1 - Semiconductor sensors for?
BS IEC 60747-14-1 on Semiconductor devices is useful for:
- Manufacturers of semiconductor devices 
- Manufacturers of electronic devices 
- Manufacturers of automotive parts 
- Electronic engineers 
- Semiconductor foundries  
Why should you use BS IEC 60747-14-1 - Semiconductor sensors?
A semiconductor device is an electronic component that contains the electronic properties of semiconductor materials.
BS IEC 60747-14-1 specifies the test method and test procedure for semiconductor sensors. This test method is useful in determining the quality of these sensors. With the help of this test method, you can identify the defects and failures in these sensors. By applying BS IEC 60747-14-1 you can ensure the sustainability of these sensors in different climatic conditions. This results in manufacturing good quality semiconductor sensors.
What’s changed since the last update?
BS IEC 60747-14-1:2010 supersedes BS IEC 60747-14-1:2000. BS IEC 60747-14-1:2010 includes some technical changes with respect to BS IEC 60747-14-1:2000. These include:
- Clause 3 has been divided into three Clauses 3, 4 and 5
- Added new terms from IEC 60747-14-5
- Added a new Clause relating to Quality assessment procedures
- Added a new Annex for the sampling procedure.
