What is BS IEC 60747‑14‑11 about?
BS IEC 60747‑14‑11 is the 14th part of the multi-series European standard that defines the terms, definitions, configuration, and test methods that can be used to evaluate and determine the performance characteristics of surface acoustic wave-based semiconductor sensors integrated with ultraviolet, illuminance, and temperature sensors.
The measurement methods described in BS IEC 60747‑14‑11 are for DC characteristics and RF characteristics, and the measurement method for RF characteristics includes a direct mode and differential amplifier mode based on feedback oscillation.
Note: This BS IEC 60747‑14‑11 excludes devices dealt with by TC 49: piezoelectric, dielectric, and electrostatic devices and associated materials for frequency control, selection, and detection.
Who is BS IEC 60747‑14‑11 for?
BS IEC 60747‑14‑11 on Semiconductor devices is useful for:
- Semiconductor foundries
- Electrical Engineers
- Researchers and scientists
- Manufacturer of automobile
- Manufacturer of electronic devices
Why should you use BS IEC 60747‑14‑11?
A semiconductor device is an electronic component that functions by utilizing the electronic properties of semiconductor material.
BS IEC 60747‑14‑11 helps to measure the UV and visible light intensity in smart devices by using SAW light sensors.
BS IEC 60747‑14‑11 helps in measuring the DC characterization and RF characterization and helps in reducing the thermal effect and provides low-frequency signals in the kHz range. Measuring the frequency difference between the sensing and reference oscillators, this BS IEC 60747‑14‑11 helps to evaluate the input rotation without temperature effect.
BS IEC 60747-14-11 allows measuring DC characteristics as well as RF characteristics, as well as evaluating the performance of semiconductor sensors that integrate UV, illuminance, and temperature sensors.
