What is BS IEC 60747-3 - Measuring method for discrete devices about?
BS IEC 60747-3 is the third part of an international standard used for semiconductor devices that specifies the characteristics and test method for discrete devices.
BS IEC 60747-3 specifies requirements for the following devices:
- Signal diodes (excluding diodes designed to operate at frequencies above several hundred MHz)
- Switching diodes (excluding high power rectifier diodes)
- Voltage-regulator diodes
- Voltage-reference diodes
- Current-regulator diodes
Who is BS IEC 60747-3 - Measuring method for discrete devices for?
BS IEC 60747-3 on Semiconductor devices is useful for:
- Manufacturers of semiconductor devices
- Manufacturers of electronic devices
- Manufacturers of automotive parts
- Electronic engineers
- Semiconductor foundries
- Quality control executives
Why should you use BS IEC 60747-3 - Measuring method for discrete devices?
A semiconductor device is an electronic component that contains the electronic properties of semiconductor material.
BS IEC 60747-3 specifies the characteristics and measuring method for discrete devices. the test methods are as follows:
- Signal and switching diodes are useful in measuring the reverse current, forward voltage, total capacity, forward time and peak forward recovery, reverse time and reverse voltage, detector voltage, and power efficiency, and also calculates the noise of the diode.
- Voltage reference diodes and voltage regulator diodes helps in measuring Working voltage, Differential resistance, Temperature coefficient of working voltage, Reverse current, Forward voltage, Junction capacitance, Noise voltage
- Current-regulator diodes is useful in calculating Regulator current, Temperature coefficient, Regulator current variation, Limiting voltage, Small-signal regulator conductance.
The characteristics help in identifying the failures in these mechanisms. By applying BS IEC 60747-3 you can ensure the reliability of these devices which results in manufacturing good quality discrete devices.
What’s changed since the last update?
BS IEC 60747-3:2013 supersedes BS 6493-1.3:1986. BS IEC 60747-3:2013 includes some technical changes with respect to BS 6493-1.3:1986. These include:
- All clauses were re-edited to latest IEC publication format and style with all contents from previous publication
- All clauses have been amended by suitable additions and deletions
