What is BS IEC 61747‑30‑3 - LCD active matrix measurement about?
Image quality is a key feature of user experience for display devices. BS IEC 61747‑30‑3 is part of the BS IEC 61747 series on liquid crystal display (LCD) devices. Active matrix liquid crystal display (AMLCD) flat-panel display uses lesser power than the passive matrix version of LCD and also displays a higher quality picture.
BS IEC 61747‑30‑3 defines general procedures for quality evaluation related to the motion performance of transmissive thin film transistor (TFT) LCDs. It defines artefacts in the moving image and methods for motion artefact measurement.
Note: IEC 61747-30-3 applies to transmissive type active-matrix liquid crystal displays.
Who is BS IEC 61747‑30‑3 - LCD active matrix measurement for?
BS IEC 61747‑30‑3 on LCD active matrix measurement is useful for:
- Manufacturers of electronic display devices
- Electrical engineers
- Product development teams / design teams
- Quality control personnel
- Research teams
Why should you use BS IEC 61747‑30‑3 - LCD active matrix measurement?
BS IEC 61747‑30‑3 specifies the motion artefact measurement methods which helps in evaluating the performance of motion artefacts of active matrix liquid crystal display. BS IEC 61747‑30‑3 helps in measuring and characterizing the spatiotemporal integration. This spatiotemporal integration can be measured with direct and indirect measurement techniques.
The direct measurement methods are useful in measuring the motion induced object blur and edge blur in active matrix liquid crystal displays. BS IEC 61747‑30‑3 is useful in measuring the motion artefact performance of LCDs with temporal step response measurement method. The high-speed method helps in evaluating the characteristics of corresponding blur.
Using BS IEC 61747‑30‑3 guidelines, you can assess the picture quality of the LCD display devices that you manufacture, and use those inputs to evolve newer products that enable end-users to enjoy high-quality display devices.
