What is BS IEC 62047‑29 - Electromechanical relaxation test method for MEMS?  
BS IEC 62047 is an international standard that discusses semiconductor devices including microelectromechanical devices. The main aim of the IEC 62047 series is to provide entities involved with semiconductor technology with best industry techniques to demonstrate the reliability and performance of their devices and components.
BS IEC 62047‑29 is the 29th part of the series that specifies a relaxation test method for measuring electromechanical properties of freestanding conductive thin films for micro-electromechanical systems (MEMS) under controlled strain and room temperature. Freestanding thin films of conductive materials are extensively utilized in MEMS, optoelectronics, and flexible/wearable electronics products.
Freestanding thin films in the products experience external and internal stresses which could be relaxed even under room temperature during a period of operation, and this relaxation leads to a time-dependent variation of electrical performances of the products. This test method is valid for isotropic, homogeneous, and linearly viscoelastic materials.
Who is BS IEC 62047‑29 - Electromechanical relaxation test method for MEMS for? 
BS IEC 62047‑29 on semiconductor devices is useful for: 
- Semiconductor and microelectromechanical device manufacturers
- Manufacturers of electronic equipment and components
- Semiconductor technology industry
- Automotive industry
- Product design engineers
- Electronics and mechanical engineers
- Quality control and testing agencies
Why should you use BS IEC 62047‑29 - Electromechanical relaxation test method for MEMS?  
Micro-electromechanical systems (MEMS) is a technology useful in creating integrated devices or systems that are combined with mechanical and electrical properties.
BS IEC 62047-29 provides best industry guidance on the electromechanical relaxation test procedures that help determine the change in electrical resistance of freestanding conductive thin films under mechanical stress.
By testing in compliance with BS IEC 62047-29 you can ensure the freestanding conductive thin films manufactured delivers high energy density, thus contributing to the optimal performance of MEMS.
