BS IEC 62396-2:2012 - Page 2

Process management for avionics. Atmospheric radiation effects. Guidelines for single event effects testing for avionics systems | Status: Superseded, Withdrawn

1 Scope This part of IEC 62396 aims to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects ( [no rendering defined for element: abbrev ] SEE) induced by atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the [no rendering defined for element: abbrev ] SEE rate of devices and boards due to atmospheric neutrons at aircraft altitudes. Although developed for the avionics industry, this process may be applied by other industrial sectors.