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Printed electronics. Printability. Measurement of qualities. Line pattern widths | Status: Current
description
1 Scope
This part of IEC 62899 specifies the measurement methods of the width of line pattern and spaces between the line patterns in printed electronics. These printed line patterns are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for vertical variance in printed electronics.
Details
Publisher
BS
File size
1.54 MB
Pages
20
Format
PDF
Publication date
2025-05-13
ISBN-13
978-2-832-70418-9
ISBN-13 plain
9782832704189
ISBN-10
2832704189