What is BS IEC 62951‑3 ‒ Evaluation of thin-film transistor characteristics about?
BS IEC 62951‑3 is the third part of an international standard used for semiconductor devices.
BS IEC 62951‑3 specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer, and others.
The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.
Who is BS IEC 62951‑3‒ Evaluation of thin-film transistor characteristics for?
BS IEC 62951‑3 on Evaluation of thin-film transistor characteristics is applicable to:
- Semiconductor foundries
- Manufacturers of electronic devices
- Manufacturers of automobile
- Testing laboratories for semiconductors
- Quality control executives
Why should you use BS IEC 62951‑3‒ Evaluation of thin-film transistor characteristics?
Flexible and stretchable electronics are developing each passing day and give new discoveries of material synthesis, mechanical design, and fabrication strategies to the world that employ soft substrates. The constant expansion in stretchable electronics has led to the new functionality of transparency. The production of transparent stretchable electronic devices has captured a lot of interest due to the potential of durable electronic systems.
Using BS IEC 62951‑3 can help you identify the appropriate test piece for evaluating the thin film transistor characteristics according to their operational requirements. This proves to be useful in determining the mechanical and electrical properties of these transistors. These properties help the users to avoid cracks or flaws and delamination from the substrate. With the help of BS IEC 62951‑3, you can measure the change in the bulge height and electrical response of the thin film transistor on a flexible substrate.
Overall, BS IEC 62951‑3 specifies the test methods and test procedures for evaluating the thin film transistor characteristics which may help the users in manufacturing good quality semiconductor devices.
