What is BS IEC 62951-4- Flexible conductive thin film about?
BS IEC 62951-4 is the fourth part of the semiconductor multi-series standard.
BS IEC 62951-4 specifies an evaluation method of the bending fatigue properties of conductive thin film and flexible substrate for the application at flexible semiconductor devices.
The films include any films deposited or bonded onto a non-conductive flexible substrate such as thin metal film, transparent conducting electrode, and thin silicon film used for flexible semiconductor devices. The electrical and mechanical behaviours of films on the substrate are evaluated. The fatigue test methods include dynamic bending fatigue test and static bending fatigue test.
Who is BS IEC 62951-4- Flexible conductive thin film for?
BS IEC 62951‑4 on Semiconductor devices is applicable to:
- Semiconductor foundries
- Manufacturers of electronic devices
- Manufacturers of automobile
- Quality control executives
Why should you use BS IEC 62951-4- Flexible conductive thin film?
A semiconductor device is an electronic component that contains the electronic properties of a semiconductor material.
BS IEC 62951-4 specifies test methods and test procedures of dynamic bending fatigue test and static bending tests. This test method is useful in resisting the repeated strain for a certain period in semiconductor devices. By using BS IEC 62951-4, you can measure the change in electrical resistance along with the change in mechanical strain.
You can use BS IEC 62951-4 best practice guidance for conducting the test methods which is useful in evaluating the flexible conductive thin film used in semiconductor devices. This helps in manufacturing good quality semiconductor devices.
